Published under an exclusive license by AIP Publishing.Stanford Synchrotron Radiation Lightsource. Lawrence Berkeley National Laboratory, Center for x-ray optics,, 1999. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan ( ) (No. The United States Government (USG) retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for USG purposes. DE-NA0003624) supported by National Nuclear Security Administration, Office of Defense Programs. DE-NA0003525), and the Nevada National Security Site, Mission Support and Test Services (Contract No. DE-AC52-07NA27344), the Sandia National Laboratory (Contract No. 89233218CNA000001), the Lawrence Livermore National Laboratory (Contract No. Department of Energy (DOE) by the Los Alamos National Laboratory (Contract No. This work was performed under the auspices of the U. The measurements were taken using selected anodes, filters, and applied voltages to produce well-defined energy lines. A broader range of energies was selected to compare results with previously published data. The absolute response of Agfa D4 x-ray film from 705 to 4620 eV has been measured using the Nevada National Security Site Manson x-ray source. These calibration efforts are vital to the accuracy of the NIF opacity measurements and are conducted in a previously un-studied x-ray energy range under a new film development protocol required by NIF. The calibration of Agfa D4 x-ray film for use in the OpSpec is communicated here. However, Agfa D4 and D3sc x-ray films’ higher spatial resolution provides increased spectral resolution to the data over the IP-TR image plates, driving the desire for regular use of x-ray film as a detecting medium. The soft x-ray Opacity Spectrometer (OpSpec) fielded at the NIF has an elliptically shaped crystal design that measures x rays in the 900–2100 eV range and currently uses an image plate as the detecting medium. Thanks to a design that features two successive fixing tanks that are replenished on the counter flow principle, the Structurix NDT S-I significantly. X-ray films remain a key asset for high-resolution x-ray spectral imaging in high-energy-density experiments conducted at the National Ignition Facility (NIF). The AGFA Structurix NDT S-I is a leading-edge processor that brings speed, operational flexibility, money-saving innovations, and environmentally friendly design together in a single package.
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